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  • image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    Authors: orcid Xin Chen;
    Xin Chen
    ORCID
    Harvested from ORCID Public Data File

    Xin Chen in OpenAIRE
    Todd Karin; orcid bw Anubhav Jain;
    Anubhav Jain
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Anubhav Jain in OpenAIRE

    Solar photovoltaic (PV) modules are susceptible to manufacturing defects, mishandling problems or extreme weather events that can limit energy production or cause early device failure. Trained professionals use electroluminescence (EL) images to identify defects in modules, however, field surveys or inline image acquisition can generate millions of EL images, which are infeasible to analyze by rote inspection. We develop a rapid automatic computer vision pipeline (∼0.5 seconds/module) to analyze EL images and identify defects including cracks, intra-cell defects, oxygen-induced defects, and solder disconnections. Defect identification is achieved with a machine learning model (Random Forest, ResNet models and YOLO) trained on 762 manually-labeled EL images of PV modules. We compare model performance on an imbalanced real-world validation set containing 134 EL images and determine that ResNet18 and YOLO are the optimal models; we next evaluated these models on a dedicated testing set (129 module images) with resulting macro F1 scores of 0.83 (ResNet18) and 0.78 (YOLO). Using a field EL survey of a PV power plant damaged in a vegetation fire, we analyze 18,954 EL images (2.4 million cells) and inspect the spatial distribution of defects on the solar modules. The results find increased frequency of ‘crack’, ‘solder’ and ‘intra-cell’ defects on the edges of the solar module closest to the ground after fire. We also find an abnormal increase of striation rings on cells which were assumed to be caused mainly in fabrication process. Our methods are published as open-source software. It can also be used to identify other kinds of defects or process different types of solar cells with minor modification on models by transfer learning.

    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/ University of Califo...arrow_drop_down
    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    Solar Energy
    Article . 2022 . Peer-reviewed
    License: Elsevier TDM
    Data sources: Crossref
    addClaim
    36
    citations36
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      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/ University of Califo...arrow_drop_down
      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      Solar Energy
      Article . 2022 . Peer-reviewed
      License: Elsevier TDM
      Data sources: Crossref
      addClaim
  • image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    Authors: orcid Xin Chen;
    Xin Chen
    ORCID
    Harvested from ORCID Public Data File

    Xin Chen in OpenAIRE
    Todd Karin; orcid bw Anubhav Jain;
    Anubhav Jain
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Anubhav Jain in OpenAIRE

    Solar photovoltaic (PV) modules are susceptible to manufacturing defects, mishandling problems or extreme weather events that can limit energy production or cause early device failure. Trained professionals use electroluminescence (EL) images to identify defects in modules, however, field surveys or inline image acquisition can generate millions of EL images, which are infeasible to analyze by rote inspection. We develop a rapid automatic computer vision pipeline (∼0.5 seconds/module) to analyze EL images and identify defects including cracks, intra-cell defects, oxygen-induced defects, and solder disconnections. Defect identification is achieved with a machine learning model (Random Forest, ResNet models and YOLO) trained on 762 manually-labeled EL images of PV modules. We compare model performance on an imbalanced real-world validation set containing 134 EL images and determine that ResNet18 and YOLO are the optimal models; we next evaluated these models on a dedicated testing set (129 module images) with resulting macro F1 scores of 0.83 (ResNet18) and 0.78 (YOLO). Using a field EL survey of a PV power plant damaged in a vegetation fire, we analyze 18,954 EL images (2.4 million cells) and inspect the spatial distribution of defects on the solar modules. The results find increased frequency of ‘crack’, ‘solder’ and ‘intra-cell’ defects on the edges of the solar module closest to the ground after fire. We also find an abnormal increase of striation rings on cells which were assumed to be caused mainly in fabrication process. Our methods are published as open-source software. It can also be used to identify other kinds of defects or process different types of solar cells with minor modification on models by transfer learning.

    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/ University of Califo...arrow_drop_down
    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    Solar Energy
    Article . 2022 . Peer-reviewed
    License: Elsevier TDM
    Data sources: Crossref
    addClaim
    36
    citations36
    popularityTop 10%
    influenceTop 10%
    impulseTop 1%
    BIP!Powered by BIP!
    more_vert
      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/ University of Califo...arrow_drop_down
      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      Solar Energy
      Article . 2022 . Peer-reviewed
      License: Elsevier TDM
      Data sources: Crossref
      addClaim
  • image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    Authors: orcid Xin Chen;
    Xin Chen
    ORCID
    Harvested from ORCID Public Data File

    Xin Chen in OpenAIRE
    orcid bw Todd Karin;
    Todd Karin
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Todd Karin in OpenAIRE
    orcid bw Cara Libby;
    Cara Libby
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Cara Libby in OpenAIRE
    orcid bw Michael Deceglie;
    Michael Deceglie
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Michael Deceglie in OpenAIRE
    +3 Authors
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao IEEE Journal of Phot...arrow_drop_down
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    IEEE Journal of Photovoltaics
    Article . 2023 . Peer-reviewed
    License: IEEE Copyright
    Data sources: Crossref
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    6
    citations6
    popularityAverage
    influenceAverage
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      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao IEEE Journal of Phot...arrow_drop_down
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      IEEE Journal of Photovoltaics
      Article . 2023 . Peer-reviewed
      License: IEEE Copyright
      Data sources: Crossref
      addClaim
  • image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    Authors: orcid Xin Chen;
    Xin Chen
    ORCID
    Harvested from ORCID Public Data File

    Xin Chen in OpenAIRE
    orcid bw Todd Karin;
    Todd Karin
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Todd Karin in OpenAIRE
    orcid bw Cara Libby;
    Cara Libby
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Cara Libby in OpenAIRE
    orcid bw Michael Deceglie;
    Michael Deceglie
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Michael Deceglie in OpenAIRE
    +3 Authors
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao IEEE Journal of Phot...arrow_drop_down
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    IEEE Journal of Photovoltaics
    Article . 2023 . Peer-reviewed
    License: IEEE Copyright
    Data sources: Crossref
    addClaim
    6
    citations6
    popularityAverage
    influenceAverage
    impulseTop 10%
    BIP!Powered by BIP!
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      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao IEEE Journal of Phot...arrow_drop_down
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      IEEE Journal of Photovoltaics
      Article . 2023 . Peer-reviewed
      License: IEEE Copyright
      Data sources: Crossref
      addClaim
  • image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    Authors: orcid bw Cara Libby;
    Cara Libby
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Cara Libby in OpenAIRE
    orcid Bijaya Paudyal;
    Bijaya Paudyal
    ORCID
    Harvested from ORCID Public Data File

    Bijaya Paudyal in OpenAIRE
    orcid Xin Chen;
    Xin Chen
    ORCID
    Harvested from ORCID Public Data File

    Xin Chen in OpenAIRE
    orcid William B. Hobbs;
    William B. Hobbs
    ORCID
    Harvested from ORCID Public Data File

    William B. Hobbs in OpenAIRE
    +2 Authors

    This study compared module power loss for 36 modules that endured various accelerated aging test sequences before installation outdoors on a 10-kWp array in Birmingham, AL, USA for 1.72 to 2.72 years. Twelve modules endured standard IEC 61215 aging tests and 24 endured Qualification Plus (Qual Plus). Modules in each group were further split into two test sequences with different exposures. Electrical parameter variations were analyzed as a function of aging test and field exposure history. Fill factor loss was determined to be the cause of observed decreases in power output during accelerated aging tests, while decreases in both open circuit voltage and fill factor dominated the power loss during subsequent on-sun testing. Quantified cell crack features were extracted via computer vision tools from electroluminescence images and correlated with power loss. Results illustrate that standard aging tests led to negligible cracks, while Qual Plus test sequences yielded more severe cracks. While correlating results from qualification tests with in-field performance degradation parameters remains a challenge, this study provides new insights on specific environmental stressors and crack features that may play a role in power loss. Insights on accelerated aging protocols are discussed.

    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/ University of Califo...arrow_drop_down
    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    IEEE Journal of Photovoltaics
    Article . 2023 . Peer-reviewed
    License: CC BY NC ND
    Data sources: Crossref
    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    addClaim
    Access Routes
    Green
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    3
    citations3
    popularityTop 10%
    influenceAverage
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      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/ University of Califo...arrow_drop_down
      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
      IEEE Journal of Photovoltaics
      Article . 2023 . Peer-reviewed
      License: CC BY NC ND
      Data sources: Crossref
      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
      addClaim
  • image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    Authors: orcid bw Cara Libby;
    Cara Libby
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Cara Libby in OpenAIRE
    orcid Bijaya Paudyal;
    Bijaya Paudyal
    ORCID
    Harvested from ORCID Public Data File

    Bijaya Paudyal in OpenAIRE
    orcid Xin Chen;
    Xin Chen
    ORCID
    Harvested from ORCID Public Data File

    Xin Chen in OpenAIRE
    orcid William B. Hobbs;
    William B. Hobbs
    ORCID
    Harvested from ORCID Public Data File

    William B. Hobbs in OpenAIRE
    +2 Authors

    This study compared module power loss for 36 modules that endured various accelerated aging test sequences before installation outdoors on a 10-kWp array in Birmingham, AL, USA for 1.72 to 2.72 years. Twelve modules endured standard IEC 61215 aging tests and 24 endured Qualification Plus (Qual Plus). Modules in each group were further split into two test sequences with different exposures. Electrical parameter variations were analyzed as a function of aging test and field exposure history. Fill factor loss was determined to be the cause of observed decreases in power output during accelerated aging tests, while decreases in both open circuit voltage and fill factor dominated the power loss during subsequent on-sun testing. Quantified cell crack features were extracted via computer vision tools from electroluminescence images and correlated with power loss. Results illustrate that standard aging tests led to negligible cracks, while Qual Plus test sequences yielded more severe cracks. While correlating results from qualification tests with in-field performance degradation parameters remains a challenge, this study provides new insights on specific environmental stressors and crack features that may play a role in power loss. Insights on accelerated aging protocols are discussed.

    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/ University of Califo...arrow_drop_down
    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
    IEEE Journal of Photovoltaics
    Article . 2023 . Peer-reviewed
    License: CC BY NC ND
    Data sources: Crossref
    image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
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    Access Routes
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      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/ University of Califo...arrow_drop_down
      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
      image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
      IEEE Journal of Photovoltaics
      Article . 2023 . Peer-reviewed
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    Authors: orcid Li, Baojie;
    Li, Baojie
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    Li, Baojie in OpenAIRE
    orcid Hansen, Clifford;
    Hansen, Clifford
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    Hansen, Clifford in OpenAIRE
    orcid Chen, Xin;
    Chen, Xin
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    Chen, Xin in OpenAIRE
    orcid Diallo, Demba;
    Diallo, Demba
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    To enable health monitoring and fault diagnosis of PV modules using current-voltage characteristics (I–V curves), it is generally necessary to correct the I–V curves measured under different environmental conditions to the standard condition. The most common correction methods are those from IEC 60891: 2021 standard. However, these methods can introduce significant errors when dealing with degraded PV modules due to the inability to account for changes in resistance. To address this, we propose an improved I–V curve procedure, denoted Pdynamic, which considers different types of degradation by dynamically deriving the correction coefficients from the measured I–V curves. To evaluate the performance, we simulate I–V curves across a wide range of irradiance and temperature for the healthy and degraded module, where the degradation involves increased series resistance, decreased shunt resistance, or both. The results reveal that Pdynamic can produce corrected I–V curves closer to the reference ones than Procedures 1, 2, and 4 of the IEC 60891:2021 standard. Moreover, Pdynamic exhibits resilience to both seasonal fluctuations and varying levels of degradation. These results highlight Pdynamic as a promising and robust I–V curve correction method, particularly for degraded PV modules. A Python-based open-source tool for this procedure is also available at https://github.com/DuraMAT/IVcorrection.

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    Renewable Energy
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      Renewable Energy
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    Authors: orcid Li, Baojie;
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    orcid Hansen, Clifford;
    Hansen, Clifford
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    orcid Chen, Xin;
    Chen, Xin
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    Chen, Xin in OpenAIRE
    orcid Diallo, Demba;
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    To enable health monitoring and fault diagnosis of PV modules using current-voltage characteristics (I–V curves), it is generally necessary to correct the I–V curves measured under different environmental conditions to the standard condition. The most common correction methods are those from IEC 60891: 2021 standard. However, these methods can introduce significant errors when dealing with degraded PV modules due to the inability to account for changes in resistance. To address this, we propose an improved I–V curve procedure, denoted Pdynamic, which considers different types of degradation by dynamically deriving the correction coefficients from the measured I–V curves. To evaluate the performance, we simulate I–V curves across a wide range of irradiance and temperature for the healthy and degraded module, where the degradation involves increased series resistance, decreased shunt resistance, or both. The results reveal that Pdynamic can produce corrected I–V curves closer to the reference ones than Procedures 1, 2, and 4 of the IEC 60891:2021 standard. Moreover, Pdynamic exhibits resilience to both seasonal fluctuations and varying levels of degradation. These results highlight Pdynamic as a promising and robust I–V curve correction method, particularly for degraded PV modules. A Python-based open-source tool for this procedure is also available at https://github.com/DuraMAT/IVcorrection.

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    Renewable Energy
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    Authors: orcid bw Xin Chen;
    Xin Chen
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    orcid bw Baojie Li;
    Baojie Li
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    Baojie Li in OpenAIRE
    orcid Jennifer L. Braid;
    Jennifer L. Braid
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    Jennifer L. Braid in OpenAIRE
    Brandon Byford; +7 Authors
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      Applied Energy
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    Authors: orcid bw Xin Chen;
    Xin Chen
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    Xin Chen in OpenAIRE
    orcid bw Baojie Li;
    Baojie Li
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    Baojie Li in OpenAIRE
    orcid Jennifer L. Braid;
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    Jennifer L. Braid in OpenAIRE
    Brandon Byford; +7 Authors
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    Authors: orcid bw Xin Chen;
    Xin Chen
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    Xin Chen in OpenAIRE
    Todd Karin; orcid bw Anubhav Jain;
    Anubhav Jain
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    Anubhav Jain in OpenAIRE

    Solar modules in utility-scale systems are expected to maintain decades of lifetime to rival conventional energy sources. However, cyclic thermomechanical loading often degrades their long-term performance, highlighting the importance of effective design to mitigate thermal expansion mismatches between module materials. Given the complex composition of solar modules, isolating the impact of individual components on overall durability remains a challenging task. In this work, we analyze a comprehensive data set that comprises bill-of-materials (BOM) and thermal cycling power loss from 251 distinct module designs to identify the predominant design factors and their impacts on the thermomechanical durability of modules. The methodology of our analysis combines machine learning modeling (random forest) and Shapley additive explanation (SHAP) to correlate design factors with power loss and interpret the model's decision-making. The interpretation reveals that silicon type (monocrystalline or polycrystalline), encapsulant thickness, busbar numbers, and wafer thickness predominantly influence the degradation. With lower power loss of around 0.6\% on average in the SHAP analysis, monocrystalline cells present better durability than polycrystalline cells. This finding is further substantiated by statistical testing on our raw data set. The SHAP analysis also demonstrates that while thicker encapsulants lead to reduced power loss, further increasing their thickness over around 0.6 to 0.7mm does not yield additional benefits, particularly for the front side one. In addition, other important BOM features such as the number of busbars are analyzed. This study provides a blueprint for utilizing explainable machine learning techniques in a complex material system and can potentially guide future research on optimizing the design of solar modules.

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    Applied Energy
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    https://dx.doi.org/10.48550/ar...
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    Authors: orcid bw Xin Chen;
    Xin Chen
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    Xin Chen in OpenAIRE
    Todd Karin; orcid bw Anubhav Jain;
    Anubhav Jain
    ORCID
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    Anubhav Jain in OpenAIRE

    Solar modules in utility-scale systems are expected to maintain decades of lifetime to rival conventional energy sources. However, cyclic thermomechanical loading often degrades their long-term performance, highlighting the importance of effective design to mitigate thermal expansion mismatches between module materials. Given the complex composition of solar modules, isolating the impact of individual components on overall durability remains a challenging task. In this work, we analyze a comprehensive data set that comprises bill-of-materials (BOM) and thermal cycling power loss from 251 distinct module designs to identify the predominant design factors and their impacts on the thermomechanical durability of modules. The methodology of our analysis combines machine learning modeling (random forest) and Shapley additive explanation (SHAP) to correlate design factors with power loss and interpret the model's decision-making. The interpretation reveals that silicon type (monocrystalline or polycrystalline), encapsulant thickness, busbar numbers, and wafer thickness predominantly influence the degradation. With lower power loss of around 0.6\% on average in the SHAP analysis, monocrystalline cells present better durability than polycrystalline cells. This finding is further substantiated by statistical testing on our raw data set. The SHAP analysis also demonstrates that while thicker encapsulants lead to reduced power loss, further increasing their thickness over around 0.6 to 0.7mm does not yield additional benefits, particularly for the front side one. In addition, other important BOM features such as the number of busbars are analyzed. This study provides a blueprint for utilizing explainable machine learning techniques in a complex material system and can potentially guide future research on optimizing the design of solar modules.

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    Applied Energy
    Article . 2025 . Peer-reviewed
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    https://dx.doi.org/10.48550/ar...
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      Applied Energy
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      https://dx.doi.org/10.48550/ar...
      Article . 2024
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    Authors: orcid Baojie Li;
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    orcid bw Todd Karin;
    Todd Karin
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    Todd Karin in OpenAIRE
    Bennet E. Meyers; orcid Xin Chen;
    Xin Chen
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    Harvested from ORCID Public Data File

    Xin Chen in OpenAIRE
    +5 Authors

    Physics-based circuit parameters like series and shunt resistance are essential to provide insights into the degradation status of photovoltaic (PV) arrays. However, calculating these parameters typically requires a full current–voltage characteristic (I-V curve), the acquisition of which involves specific measurement devices and costly methods. Thus, I-V curves of the PV system level are often not available. This paper proposes a methodology (PVPRO) to estimate these I-V curve parameters using only operation (string-level DC voltage and current) and weather data (irradiance and temperature). PVPRO first performs multi-stage data pre-processing to remove noisy data. Next, the time-series DC data are used to fit an equivalent circuit single-diode model (SDM) to estimate the circuit parameters by minimizing the differences between the measured and estimated values. In this way, the time evolutions of the SDM parameters are obtained. We evaluate PVPRO on synthetic datasets and find an excellent estimation of both SDM and the key I-V parameters (e.g., open-circuit voltage, short-circuit current, maximum power, etc.) with an average relative error of 0.55%. The performance, especially the extracted degradation rate of parameters, is robust to various measurement noises and the presence of faults. In addition, PVPRO is applied to a 271 kW PV field system. The relative error between the real and estimated operation voltage and current is less than 1%, suggesting that degradation trends are well captured. PVPRO represents a promising open-source tool to extract the time-series degradation trends of key PV parameters from routine operation data.

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    Solar Energy
    Article . 2023 . Peer-reviewed
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      Solar Energy
      Article . 2023 . Peer-reviewed
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    Authors: orcid Baojie Li;
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    orcid bw Todd Karin;
    Todd Karin
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    Bennet E. Meyers; orcid Xin Chen;
    Xin Chen
    ORCID
    Harvested from ORCID Public Data File

    Xin Chen in OpenAIRE
    +5 Authors

    Physics-based circuit parameters like series and shunt resistance are essential to provide insights into the degradation status of photovoltaic (PV) arrays. However, calculating these parameters typically requires a full current–voltage characteristic (I-V curve), the acquisition of which involves specific measurement devices and costly methods. Thus, I-V curves of the PV system level are often not available. This paper proposes a methodology (PVPRO) to estimate these I-V curve parameters using only operation (string-level DC voltage and current) and weather data (irradiance and temperature). PVPRO first performs multi-stage data pre-processing to remove noisy data. Next, the time-series DC data are used to fit an equivalent circuit single-diode model (SDM) to estimate the circuit parameters by minimizing the differences between the measured and estimated values. In this way, the time evolutions of the SDM parameters are obtained. We evaluate PVPRO on synthetic datasets and find an excellent estimation of both SDM and the key I-V parameters (e.g., open-circuit voltage, short-circuit current, maximum power, etc.) with an average relative error of 0.55%. The performance, especially the extracted degradation rate of parameters, is robust to various measurement noises and the presence of faults. In addition, PVPRO is applied to a 271 kW PV field system. The relative error between the real and estimated operation voltage and current is less than 1%, suggesting that degradation trends are well captured. PVPRO represents a promising open-source tool to extract the time-series degradation trends of key PV parameters from routine operation data.

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    Solar Energy
    Article . 2023 . Peer-reviewed
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      Solar Energy
      Article . 2023 . Peer-reviewed
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    Authors: Baojie Li; orcid bw Xin Chen;
    Xin Chen
    ORCID
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    Xin Chen in OpenAIRE
    orcid bw Anubhav Jain;
    Anubhav Jain
    ORCID
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    Anubhav Jain in OpenAIRE

    Power modeling, widely applied for health monitoring and power prediction, is crucial for the efficiency and reliability of Photovoltaic (PV) systems. The most common approach for power modeling uses a physical equivalent circuit model, with the core challenge being the estimation of model parameters. Traditional parameter estimation either relies on datasheet information, which does not reflect the system's current health status, especially for degraded PV systems, or requires additional I-V characterization, which is generally unavailable for large-scale PV systems. Thus, we build upon our previously developed tool, PV-Pro (originally proposed for degradation analysis), to enhance its application for power modeling of degraded PV systems. PV-Pro extracts model parameters from production data without requiring I-V characterization. This dynamic model, periodically updated, can closely capture the actual degradation status, enabling precise power modeling. PV-Pro is compared with popular power modeling techniques, including persistence, nominal physical, and various machine learning models. The results indicate that PV-Pro achieves outstanding power modeling performance, with an average nMAE of 1.4 % across four field-degraded PV systems, reducing error by 17.6 % compared to the best alternative technique. Furthermore, PV-Pro demonstrates robustness across different seasons and severities of degradation. The tool is available as a Python package at https://github.com/DuraMAT/pvpro.

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    Renewable Energy
    Article . 2024 . Peer-reviewed
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    Authors: Baojie Li; orcid bw Xin Chen;
    Xin Chen
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Xin Chen in OpenAIRE
    orcid bw Anubhav Jain;
    Anubhav Jain
    ORCID
    Derived by OpenAIRE algorithms or harvested from 3rd party repositories

    Anubhav Jain in OpenAIRE

    Power modeling, widely applied for health monitoring and power prediction, is crucial for the efficiency and reliability of Photovoltaic (PV) systems. The most common approach for power modeling uses a physical equivalent circuit model, with the core challenge being the estimation of model parameters. Traditional parameter estimation either relies on datasheet information, which does not reflect the system's current health status, especially for degraded PV systems, or requires additional I-V characterization, which is generally unavailable for large-scale PV systems. Thus, we build upon our previously developed tool, PV-Pro (originally proposed for degradation analysis), to enhance its application for power modeling of degraded PV systems. PV-Pro extracts model parameters from production data without requiring I-V characterization. This dynamic model, periodically updated, can closely capture the actual degradation status, enabling precise power modeling. PV-Pro is compared with popular power modeling techniques, including persistence, nominal physical, and various machine learning models. The results indicate that PV-Pro achieves outstanding power modeling performance, with an average nMAE of 1.4 % across four field-degraded PV systems, reducing error by 17.6 % compared to the best alternative technique. Furthermore, PV-Pro demonstrates robustness across different seasons and severities of degradation. The tool is available as a Python package at https://github.com/DuraMAT/pvpro.

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