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  • image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    Authors: Zhou Y.; Xie Y. -Z.; Zhang D. -Z.; Dong N.; +2 Authors

    Nanosecond-level transient electromagnetic disturbance (TED), including very fast transient overvoltage caused by operation of disconnectors, high-altitude electromagnetic pulse, and many other fast transients may interfere or even damage the electrical equipment. As one of the main overvoltage protective equipment, the protective performance of metal-oxide surge arresters (MOAs) under nanosecond-level TED should be investigated and then compared with that under microsecond-level TED, especially the lightning impulse. Based on a testing platform containing a 400-kV pulse generator with adjustable rise time from 5 to 100 ns, the behaviors of nonlinearity, fast impulse response, and converting impedances of three types of 10-kV MOAs under TED with different rise time were explored experimentally in this article. The peak residual voltages of 10-kV MOAs under TED with the rise time of 5 ns at 5 kA are 50.2–60.7% higher than those under the lightning impulse. The rise time of TED has significant influence on the peak voltage and impedance converting behaviors of MOAs. A circuit model of 10-kV MOAs under nanosecond-level TED is built and validated by experimental results, which can be applied in insulation coordination and design of protective devices against TED.

    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Publications Open Re...arrow_drop_down
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    IEEE Transactions on Electromagnetic Compatibility
    Article . 2021 . Peer-reviewed
    License: IEEE Copyright
    Data sources: Crossref
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      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Publications Open Re...arrow_drop_down
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      IEEE Transactions on Electromagnetic Compatibility
      Article . 2021 . Peer-reviewed
      License: IEEE Copyright
      Data sources: Crossref
      addClaim

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  • image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    Authors: Zhou Y.; Xie Y. -Z.; Zhang D. -Z.; Dong N.; +2 Authors

    Nanosecond-level transient electromagnetic disturbance (TED), including very fast transient overvoltage caused by operation of disconnectors, high-altitude electromagnetic pulse, and many other fast transients may interfere or even damage the electrical equipment. As one of the main overvoltage protective equipment, the protective performance of metal-oxide surge arresters (MOAs) under nanosecond-level TED should be investigated and then compared with that under microsecond-level TED, especially the lightning impulse. Based on a testing platform containing a 400-kV pulse generator with adjustable rise time from 5 to 100 ns, the behaviors of nonlinearity, fast impulse response, and converting impedances of three types of 10-kV MOAs under TED with different rise time were explored experimentally in this article. The peak residual voltages of 10-kV MOAs under TED with the rise time of 5 ns at 5 kA are 50.2–60.7% higher than those under the lightning impulse. The rise time of TED has significant influence on the peak voltage and impedance converting behaviors of MOAs. A circuit model of 10-kV MOAs under nanosecond-level TED is built and validated by experimental results, which can be applied in insulation coordination and design of protective devices against TED.

    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Publications Open Re...arrow_drop_down
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    IEEE Transactions on Electromagnetic Compatibility
    Article . 2021 . Peer-reviewed
    License: IEEE Copyright
    Data sources: Crossref
    addClaim

    This Research product is the result of merged Research products in OpenAIRE.

    You have already added works in your ORCID record related to the merged Research product.
    17
    citations17
    popularityTop 10%
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      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Publications Open Re...arrow_drop_down
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      IEEE Transactions on Electromagnetic Compatibility
      Article . 2021 . Peer-reviewed
      License: IEEE Copyright
      Data sources: Crossref
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  • Authors: Dao-zhong Zhang; Yan-zhao Xie; Yi Zhou; Yu-ying Wu; +1 Authors

    High-altitude electromagnetic pulse (HEMP) has attracted considerable attention for its influence on electrical equipment. HEMP is divided into three parts: early time HEMP (E1), intermediate-time HEMP (E2), and late-time HEMP (E3). Most studies focused on E1 alone, while few investigated others. However, the electrical equipment may be disturbed by more than one part since these three parts co-exist in a HEMP environment. The pulse current injection (PCI) test is an effective immunity test method for evaluating the sensitivity and susceptibility of electrical equipment. To investigate the responses of electrical equipment excited by the consecutive E1 and E2 and compare with those under the individual E1 or E2, this paper builds a PCI platform that can carry out PCI tests with the consecutive E1 and E2 conducted current. To output the E1 current and the E2 current consecutively, which exhibit significant differences in the rise time (20 ns and 1.5 μs), peak current (2500 and 250 A), and full width at half maximum (FWHM, 500–550 ns and 3–5 ms), an E1&E2 coupler with a fast-closing high-current trigger switch is designed in this paper. Finally, some 10-kV epoxy insulators are tested in the developed platform, which shows the capacity of the proposed platform to test the immunity of electrical equipment with the consecutive E1 and E2 conducted current.

    addClaim

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  • Authors: Dao-zhong Zhang; Yan-zhao Xie; Yi Zhou; Yu-ying Wu; +1 Authors

    High-altitude electromagnetic pulse (HEMP) has attracted considerable attention for its influence on electrical equipment. HEMP is divided into three parts: early time HEMP (E1), intermediate-time HEMP (E2), and late-time HEMP (E3). Most studies focused on E1 alone, while few investigated others. However, the electrical equipment may be disturbed by more than one part since these three parts co-exist in a HEMP environment. The pulse current injection (PCI) test is an effective immunity test method for evaluating the sensitivity and susceptibility of electrical equipment. To investigate the responses of electrical equipment excited by the consecutive E1 and E2 and compare with those under the individual E1 or E2, this paper builds a PCI platform that can carry out PCI tests with the consecutive E1 and E2 conducted current. To output the E1 current and the E2 current consecutively, which exhibit significant differences in the rise time (20 ns and 1.5 μs), peak current (2500 and 250 A), and full width at half maximum (FWHM, 500–550 ns and 3–5 ms), an E1&E2 coupler with a fast-closing high-current trigger switch is designed in this paper. Finally, some 10-kV epoxy insulators are tested in the developed platform, which shows the capacity of the proposed platform to test the immunity of electrical equipment with the consecutive E1 and E2 conducted current.

    addClaim

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    You have already added works in your ORCID record related to the merged Research product.
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The following results are related to Energy Research. Are you interested to view more results? Visit OpenAIRE - Explore.
2 Research products
  • image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    Authors: Zhou Y.; Xie Y. -Z.; Zhang D. -Z.; Dong N.; +2 Authors

    Nanosecond-level transient electromagnetic disturbance (TED), including very fast transient overvoltage caused by operation of disconnectors, high-altitude electromagnetic pulse, and many other fast transients may interfere or even damage the electrical equipment. As one of the main overvoltage protective equipment, the protective performance of metal-oxide surge arresters (MOAs) under nanosecond-level TED should be investigated and then compared with that under microsecond-level TED, especially the lightning impulse. Based on a testing platform containing a 400-kV pulse generator with adjustable rise time from 5 to 100 ns, the behaviors of nonlinearity, fast impulse response, and converting impedances of three types of 10-kV MOAs under TED with different rise time were explored experimentally in this article. The peak residual voltages of 10-kV MOAs under TED with the rise time of 5 ns at 5 kA are 50.2–60.7% higher than those under the lightning impulse. The rise time of TED has significant influence on the peak voltage and impedance converting behaviors of MOAs. A circuit model of 10-kV MOAs under nanosecond-level TED is built and validated by experimental results, which can be applied in insulation coordination and design of protective devices against TED.

    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Publications Open Re...arrow_drop_down
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    IEEE Transactions on Electromagnetic Compatibility
    Article . 2021 . Peer-reviewed
    License: IEEE Copyright
    Data sources: Crossref
    addClaim

    This Research product is the result of merged Research products in OpenAIRE.

    You have already added works in your ORCID record related to the merged Research product.
    17
    citations17
    popularityTop 10%
    influenceTop 10%
    impulseTop 10%
    BIP!Powered by BIP!
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      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Publications Open Re...arrow_drop_down
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      IEEE Transactions on Electromagnetic Compatibility
      Article . 2021 . Peer-reviewed
      License: IEEE Copyright
      Data sources: Crossref
      addClaim

      This Research product is the result of merged Research products in OpenAIRE.

      You have already added works in your ORCID record related to the merged Research product.
  • image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    Authors: Zhou Y.; Xie Y. -Z.; Zhang D. -Z.; Dong N.; +2 Authors

    Nanosecond-level transient electromagnetic disturbance (TED), including very fast transient overvoltage caused by operation of disconnectors, high-altitude electromagnetic pulse, and many other fast transients may interfere or even damage the electrical equipment. As one of the main overvoltage protective equipment, the protective performance of metal-oxide surge arresters (MOAs) under nanosecond-level TED should be investigated and then compared with that under microsecond-level TED, especially the lightning impulse. Based on a testing platform containing a 400-kV pulse generator with adjustable rise time from 5 to 100 ns, the behaviors of nonlinearity, fast impulse response, and converting impedances of three types of 10-kV MOAs under TED with different rise time were explored experimentally in this article. The peak residual voltages of 10-kV MOAs under TED with the rise time of 5 ns at 5 kA are 50.2–60.7% higher than those under the lightning impulse. The rise time of TED has significant influence on the peak voltage and impedance converting behaviors of MOAs. A circuit model of 10-kV MOAs under nanosecond-level TED is built and validated by experimental results, which can be applied in insulation coordination and design of protective devices against TED.

    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Publications Open Re...arrow_drop_down
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
    IEEE Transactions on Electromagnetic Compatibility
    Article . 2021 . Peer-reviewed
    License: IEEE Copyright
    Data sources: Crossref
    addClaim

    This Research product is the result of merged Research products in OpenAIRE.

    You have already added works in your ORCID record related to the merged Research product.
    17
    citations17
    popularityTop 10%
    influenceTop 10%
    impulseTop 10%
    BIP!Powered by BIP!
    more_vert
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Publications Open Re...arrow_drop_down
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
      IEEE Transactions on Electromagnetic Compatibility
      Article . 2021 . Peer-reviewed
      License: IEEE Copyright
      Data sources: Crossref
      addClaim

      This Research product is the result of merged Research products in OpenAIRE.

      You have already added works in your ORCID record related to the merged Research product.
  • Authors: Dao-zhong Zhang; Yan-zhao Xie; Yi Zhou; Yu-ying Wu; +1 Authors

    High-altitude electromagnetic pulse (HEMP) has attracted considerable attention for its influence on electrical equipment. HEMP is divided into three parts: early time HEMP (E1), intermediate-time HEMP (E2), and late-time HEMP (E3). Most studies focused on E1 alone, while few investigated others. However, the electrical equipment may be disturbed by more than one part since these three parts co-exist in a HEMP environment. The pulse current injection (PCI) test is an effective immunity test method for evaluating the sensitivity and susceptibility of electrical equipment. To investigate the responses of electrical equipment excited by the consecutive E1 and E2 and compare with those under the individual E1 or E2, this paper builds a PCI platform that can carry out PCI tests with the consecutive E1 and E2 conducted current. To output the E1 current and the E2 current consecutively, which exhibit significant differences in the rise time (20 ns and 1.5 μs), peak current (2500 and 250 A), and full width at half maximum (FWHM, 500–550 ns and 3–5 ms), an E1&E2 coupler with a fast-closing high-current trigger switch is designed in this paper. Finally, some 10-kV epoxy insulators are tested in the developed platform, which shows the capacity of the proposed platform to test the immunity of electrical equipment with the consecutive E1 and E2 conducted current.

    addClaim

    This Research product is the result of merged Research products in OpenAIRE.

    You have already added works in your ORCID record related to the merged Research product.
    1
    citations1
    popularityAverage
    influenceAverage
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      addClaim

      This Research product is the result of merged Research products in OpenAIRE.

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  • Authors: Dao-zhong Zhang; Yan-zhao Xie; Yi Zhou; Yu-ying Wu; +1 Authors

    High-altitude electromagnetic pulse (HEMP) has attracted considerable attention for its influence on electrical equipment. HEMP is divided into three parts: early time HEMP (E1), intermediate-time HEMP (E2), and late-time HEMP (E3). Most studies focused on E1 alone, while few investigated others. However, the electrical equipment may be disturbed by more than one part since these three parts co-exist in a HEMP environment. The pulse current injection (PCI) test is an effective immunity test method for evaluating the sensitivity and susceptibility of electrical equipment. To investigate the responses of electrical equipment excited by the consecutive E1 and E2 and compare with those under the individual E1 or E2, this paper builds a PCI platform that can carry out PCI tests with the consecutive E1 and E2 conducted current. To output the E1 current and the E2 current consecutively, which exhibit significant differences in the rise time (20 ns and 1.5 μs), peak current (2500 and 250 A), and full width at half maximum (FWHM, 500–550 ns and 3–5 ms), an E1&E2 coupler with a fast-closing high-current trigger switch is designed in this paper. Finally, some 10-kV epoxy insulators are tested in the developed platform, which shows the capacity of the proposed platform to test the immunity of electrical equipment with the consecutive E1 and E2 conducted current.

    addClaim

    This Research product is the result of merged Research products in OpenAIRE.

    You have already added works in your ORCID record related to the merged Research product.
    1
    citations1
    popularityAverage
    influenceAverage
    impulseAverage
    BIP!Powered by BIP!
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      addClaim

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