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Polymer Engineering & Science
Article . 1983 . Peer-reviewed
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Materials for multilevel resist schemes

Authors: C. W. Wilkins; Elsa Reichmanis; E. Ong;
Abstract
AbstractBilevel resist processing techniques, offering the advantage of forming images on a planar substrate, and thus improving the resolution capability of optical projection printers are discussed. After careful consideration of such materials characteristics as UV absorption, solubility, compatibility, and Tg, practical schemes can be developed, the simplest of which is one that uses conventional novolak‐quinone diazide positive resists as the top masking layer and short wavelength sensitive methacrylate based resists to planarize the substrate. Sub‐micron resolution and excellent line‐width control are achieved in these systems.
citations This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).4 popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.Average influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).Top 10% impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.Average

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citations
Citations provided by BIP!
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
popularity
Popularity provided by BIP!
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
4
Average
Top 10%
Average
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