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Threshold energy surface and frenkel pair resistivity for Cu

Abstract In-situ electrical resistivity damage-rate measurements in the high voltage electron microscope have been used to study electron irradiation induced defect production in copper single crystals at T . Analysis of the directional and energy dependence yields a threshold energy surface that is significantly different from those of previous investigations: two pockets of low threshold energy centered at 〈100〉 and 〈110〉 surrounded by regions of much higher threshold energy. The corresponding damage function exhibits a plateau at 0.6 Frenkel pairs. The present results imply a Frenkel pair resistivity for Cu of (2.75 +0.6−0.2) × 10−4 Ω cm.
- University of North Texas United States
- Northwestern University United States
- University of North Texas United States
- Northwestern State University United States
- Argonne National Laboratory United States
Lepton Beams, Particle Beams, Frenkel Defects, Electron Beams, Monocrystals, Crystals, Transition Elements, Threshold Energy, Electron Microscopy, Physical Radiation Effects, Point Defects, Microscopy, Energy, Beams, 36 Materials Science, Vacancies 360106* -- Metals & Alloys-- Radiation Effects, Ultralow Temperature, Elements, Crystal Defects, Radiation Effects, Damage, Metals, Crystal Structure, Copper
Lepton Beams, Particle Beams, Frenkel Defects, Electron Beams, Monocrystals, Crystals, Transition Elements, Threshold Energy, Electron Microscopy, Physical Radiation Effects, Point Defects, Microscopy, Energy, Beams, 36 Materials Science, Vacancies 360106* -- Metals & Alloys-- Radiation Effects, Ultralow Temperature, Elements, Crystal Defects, Radiation Effects, Damage, Metals, Crystal Structure, Copper
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