AbstractWe have measured the effect of degradation on the I-V characteristics in APFO3:PCBM solar cells. The solar cell devices were subject to ambient air under simulated solar illumination. We found that the degradation resulted in a lowering of the fill factor and short circuit current while the open circuit voltage remained unchanged. In order to gain insight into what has caused the degraded I-V characteristics we have studied the active layer film using various techniques. We found clear spectral changes both in absorption and in photoinduced absorption spectroscopy correlated with increased carrier lifetimes and lowered mobility when comparing the degraded film with a pristine one. The results show a significant degradation of the active layer causing a lower fill-factor and short circuit current.