Poly-crystalline tungsten (W) samples were simultaneously irradiated with Helium (He) and Deuterium (D) ions using the triple-ion implantation device. He effect on D retention and transportation was studied using different combination of ion energies and He/D flux ratios in the simultaneous implantation. The experimental results show that D trapping at dislocation loops is significantly reduced in the case of 3 keV He+–3 keV D2+at He/D flux ratios over 0.6. D trapping by stronger trapping sites such as vacancies and vacancy clusters showed less dependence on the flux ratio. On the contrary, the D retention increases at each He/D flux ratio in the case of 3 keV He+–1 keV D2+compared to only D2+ implantation even the He/D flux ratio reaches a value of 1.0. TEM observations confirmed that dense dislocation loops are formed rather than He bubbles, which is responsible for the enhanced D retention in W. Keywords: Simultaneous implantation, D retention, Helium, Flux ratio, Transportation, Thermal desorption spectroscopy