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Solar Energy Materials and Solar Cells
Article . 2004 . Peer-reviewed
License: Elsevier TDM
Data sources: Crossref
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Multi-wavelength transverse probe lifetime measurement for the characterization of recombination lifetime in thin mc-Si samples for photovoltaic industry use

Authors: Andrea Irace; G.F. Vitale; F. Sorrentino;
Abstract
A contactless, all-optical and non-destructive technique for simultaneous measurement of minority carrier recombination lifetime and surface recombination velocity, at low injection level, in multi-crystalline silicon samples is presented. Being contactless and non-destructive with respect to the surface to be analyzed, the method does not need any surface treatment to be applied and therefore is suitable for routine lifetime characterization in solar cell fabrication processes.
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citations
Citations provided by BIP!
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
popularity
Popularity provided by BIP!
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
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