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Microelectronics Reliability
Article . 1982 . Peer-reviewed
License: Elsevier TDM
Data sources: Crossref
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Delay times in fault tree analysis

Authors: L. Camarinopoulos; Axel Becker;
Abstract
Abstract In reliability analysis of technical systems the failure frequency of cut sets alone is often insufficient to assess the probability of an undesired event. In many systems an undesired event occurs after failures of system elements, however not before a limited time period is over. Since system elements can be repaired the delay times can have a crucial effect on the probability of an undesired event. Here a method is developed to consider as many different delay times as desired in calculating the probability of the fault tree top event.
Related Organizations
- Technical University of Berlin Germany
citations This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).3 popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.Average influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).Top 10% impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.Average

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citations
Citations provided by BIP!
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
popularity
Popularity provided by BIP!
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
3
Average
Top 10%
Average
bronze