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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Journal of The Elect...arrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
Journal of The Electrochemical Society
Article . 1975 . Peer-reviewed
License: IOP Copyright Policies
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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
Chemischer Informationsdienst
Article . 1975 . Peer-reviewed
License: Wiley Online Library User Agreement
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Journal of The Electrochemical Society
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Investigation of Breakdown and Resistivity Striations in High‐Voltage Silicon Diodes

descriptionPublicationkeyboard_double_arrow_right Article , Journal , Other literature type 01 Aug 1975Publisher:The Electrochemical SocietyJournal:Journal of The Electrochemical Society, volume 122, pages 1,113-1,117 (issn: 0013-4651, eissn: 1945-7111, Copyright policy )
Authors: A. Muehlbauer; P. Voss; F. Sedlak;

doi: 10.1149/1.2134405 , 10.1002/chin.197542015

Investigation of Breakdown and Resistivity Striations in High‐Voltage Silicon Diodes

Abstract

AbstractDas Durchschlagverhalten von Hochspannungs‐Dioden, die aus parallel zur Zylinderachse geschnittenen Si‐Plättchen bestehen, wird beobachtet.

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