Simulations of Ion Migration in the LCLS RF Gun and Injector
Simulations of Ion Migration in the LCLS RF Gun and Injector
Simulations of ion migration in the LCLS RF gun and injector A. Brachmann On behalf of the LCLS commissioning team The motivation for this work was the observed surface contamination of the first LCLS RF gun copper cathode. We will present the results of simulations in regards to ion migration in the LCLS gun. Ions of residual gases will be created by interaction of molecular gas species with the UV drive laser beam and by the electron beam itself. The larger part of those ionized molecules remain in the vicinity of creation, are transported towards beam line walls or away from the cathode. However a significant fraction gains enough kinetic energy to be focused by RF and magnetic fields, reaching the cathode and producing an undesirable increase of the cathode¿s surface work function. Although this fraction is small, during long term operation, this effect becomes a significant factor limiting the source performance.
Proceedings of the 1st International Particle Accelerator Conference, IPAC2010, Kyoto, Japan
- University of North Texas United States
- University of North Texas United States
43 Particle Accelerators, Lasers, Performance, Accelerators,Accphy, Electron Beams, Work Functions Accelerators,Accphy, A06 Free Electron Lasers, Accelerator Physics, Magnetic Fields, Kinetic Energy, Surface Contamination, 02 Synchrotron Light Sources and FELs, Gases, Copper, Accelerators
43 Particle Accelerators, Lasers, Performance, Accelerators,Accphy, Electron Beams, Work Functions Accelerators,Accphy, A06 Free Electron Lasers, Accelerator Physics, Magnetic Fields, Kinetic Energy, Surface Contamination, 02 Synchrotron Light Sources and FELs, Gases, Copper, Accelerators
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