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Gate Current in p-GaN Gate HEMTs as a Channel Temperature Sensitive Parameter: A Comparative Study between Schottky- and Ohmic-Gate GaN HEMTs

doi: 10.3390/en14238055
handle: 11588/906183
In this work, a comparison between the gate-driving requirements of p-GaN HEMTs with gate contact of Schottky and Ohmic type is presented. Furthermore, the presence of a gate current of different magnitude is experimentally verified for both types of devices. Successively, the possibility of using the gate current as a temperature-sensitive parameter and its monitoring during real circuit operation is proposed. The viability of monitoring the gate current without introducing additional complexity in the gate driver is examined through experimental measurements on commercially available p-GaN HEMTs.
Gate driver, Boost converter; GaN; Gate driver; HEMT; Ohmic contact; P-GaN gate; Schottky contact; Short circuit; TSEP, Technology, Control and Optimization, Schottky contact, Renewable Energy, Sustainability and the Environment, Boost converter, T, Energy Engineering and Power Technology, Short circuit, TSEP, Ohmic contact, P-GaN gate, GaN, GaN; HEMT; gate driver; p-GaN gate; TSEP; Schottky contact; Ohmic contact; short circuit; boost converter, Electrical and Electronic Engineering, p-GaN gate, Engineering (miscellaneous), HEMT, Energy (miscellaneous), gate driver
Gate driver, Boost converter; GaN; Gate driver; HEMT; Ohmic contact; P-GaN gate; Schottky contact; Short circuit; TSEP, Technology, Control and Optimization, Schottky contact, Renewable Energy, Sustainability and the Environment, Boost converter, T, Energy Engineering and Power Technology, Short circuit, TSEP, Ohmic contact, P-GaN gate, GaN, GaN; HEMT; gate driver; p-GaN gate; TSEP; Schottky contact; Ohmic contact; short circuit; boost converter, Electrical and Electronic Engineering, p-GaN gate, Engineering (miscellaneous), HEMT, Energy (miscellaneous), gate driver
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