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Euclidean Distance-Based Tree Algorithm for Fault Detection and Diagnosis in Photovoltaic Systems

handle: 2117/428877
In this paper, a new methodology for fault detection and diagnosis in photovoltaic systems is proposed. This method employs a novel Euclidean distance-based tree algorithm to classify various considered faults. Unlike the decision tree, which requires the use of the Gini index to split the data, this algorithm mainly relies on computing distances between an arbitrary point in the space and the entire dataset. Then, the minimum and the maximum distances of each class are extracted and ordered in ascending order. The proposed methodology requires four attributes: Solar irradiance, temperature, and the coordinates of the maximum power point (Impp, Vmpp). The developed procedure for fault detection and diagnosis is implemented and applied to classify a dataset comprising seven distinct classes: normal operation, string disconnection, short circuit of three modules, short circuit of ten modules, and three cases of string disconnection, with 25%, 50%, and 75% of partial shading. The obtained results demonstrate the high efficiency and effectiveness of the proposed methodology, with a classification accuracy reaching 97.33%. A comparison study between the developed fault detection and diagnosis methodology and Support Vector Machine, Decision Tree, Random Forest, and K-Nearest Neighbors algorithms is conducted. The proposed procedure shows high performance against the other algorithms in terms of accuracy, precision, recall, and F1-score.
short circuits, Technology, partial shading, binary classification, T, Short circuits, Fault detection and diagnosis, fault detection and diagnosis, Partial shading, PV systems, Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica, FDD, Binary classification, supervision algorithm, Supervision algorithm
short circuits, Technology, partial shading, binary classification, T, Short circuits, Fault detection and diagnosis, fault detection and diagnosis, Partial shading, PV systems, Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica, FDD, Binary classification, supervision algorithm, Supervision algorithm
