The Electrical Resistance of Ni<sub>50</sub>Ti<sub>30</sub>Hf<sub>20</sub> and Ni<sub>50</sub>Ti<sub>40.5</sub>Hf<sub>9.5</sub> Melt-Spun Ribbons during Current-Driven Thermal Cycles
Copyright policy ) Michele Pozzi; G. Airoldi; A.V. Shelyakov; S. Piredda;
The Electrical Resistance of Ni<sub>50</sub>Ti<sub>30</sub>Hf<sub>20</sub> and Ni<sub>50</sub>Ti<sub>40.5</sub>Hf<sub>9.5</sub> Melt-Spun Ribbons during Current-Driven Thermal Cycles
The electrical resistance of Ni 50 Ti 30 Hf 20 and Ni 50 Ti 40.5 Hf 9.5 alloys during Stress Assisted Two Way Memory Effect was investigated with the aim to deduce the relationship between electrical resistance and deformation across the transformation range. Results show an almost linear relationship although a crossing point between increasing and decreasing deformation may compromise the use of these alloys actuators.
- University of Milan Italy
- University of Milano-Bicocca Italy
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This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
Citations provided by BIP!popularityPopularity provided by BIP!
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
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