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Progress in Mechanically Shuttered Time-Resolved Photoluminescence Imaging of Silicon Wafers

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 01 Jan 2011 Germany English Publisher:WIP

Authors: Kiliani, David; Micard, Gabriel; Herguth, Axel; Hahn, Giso;

doi: 10.4229/26theupvsec2011-2bv.2.20

Progress in Mechanically Shuttered Time-Resolved Photoluminescence Imaging of Silicon Wafers

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Abstract

Recently two approaches to extend the photoluminescence imaging (PLI) technique by evaluating the dynamic properties of the sample have been presented. Time-resolved photoluminescence measurements may provide calibration-free maps of the effective minority charge carrier lifetime in silicon wafers. Due to the transient measurement they minimize errors due to lateral inhomogeneities in setup or sample, which would usually contribute linearly to steady-state PLI measurements. In this work, we will focus on mechanically shuttered time-resolved photoluminescence imaging (TR-PLI), as it provides a high measurement range down to 5 μs at low hardware costs.

26th European Photovoltaic Solar Energy Conference and Exhibition; 1463-1466

Country

Germany

Related Organizations

University of Konstanz
Germany

Keywords

lifetime, silicon (Si), Wafer-based Silicon Solar Cells and Materials Technology, Silicon Solar Cell Characterisation and Modelling, photoluminescence, info:eu-repo/classification/ddc/530

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