• Energy Research

The economic return on investment of a commercial photovoltaic system depends greatly on its performance over the long term and, hence, its degradation rate. Many methods have been proposed for assessing system degradation rates from outdoor performance data. However, comparing reported values from one analyst and research group to another requires a common baseline of performance; consistency between methods and analysts can be a challenge. An interlaboratory study was conducted involving different volunteer analysts reporting on the same photovoltaic performance data using different methodologies. Initial variability of the reported degradation rates was so high that analysts could not come to a consensus whether a system degraded or not. More consistent values are received when written guidance is provided to each analyst. Further improvements in analyst variance was accomplished by using the free open-source software RdTools, allowing a reduction in variance between analysts by more than two orders of magnitude over the first round, where multiple analysis methods are allowed. This article highlights many pitfalls in conducting “routine” degradation analysis, and it addresses some of the factors that must be considered when comparing degradation results reported by different analysts or methods.

The longevity of solar photovoltaic modules depends on the durability and reliability of their components, one of which is the solder bonds in interconnect ribbons. The solder joints experience stresses from thermal cycling and constant elevated temperatures (40 °C–70 °C) in regular field operation leading to thermo-mechanical fatigue and intermetallic compound formation. To study the end-of-life wear-out mechanisms and to obtain activation energy of solder bond degradation, two field-aged modules from Arizona—a 21-year-old Solarex MSX60 module (with Sn62Pb36Ag2 at the solder joints) and an 18-year-old Siemens M55 module (with Sn60Pb40 at the solder joints)—underwent 800 and 400 modified thermal cycles, respectively. Using three heating blankets, each module had three temperature zones maintained at 85, 95, and 105 °C during the 15-min hot dwell time of the thermal cycle. Cell-level series resistance data obtained from three temperature zones enabled the calculation of activation energy for solder bond degradation for the MSX60 and the M55 modules to be 0.12 eV and 0.35 eV, respectively. From each temperature zone in both modules, busbar-solder samples were obtained, imaged through SEM, and analyzed with energy-dispersive X-ray spectroscopy. In the MSX60 module with traces of Ag in the solder material, phase segregation and growth were primarily observed at high temperatures. For M55 modules without Ag in the solder material, major phase segregation was observed in all temperature zones. The IMC thickness for both modules increased with increasing module temperature. The beneficial effect of Ag in solder material on mitigating solder bond degradation is presented.

Encapsulant browning is one of the most common degradation modes found in crystalline silicon field-aged photovoltaic modules. Browning, usually undetected unless severe, reduces the short-circuit current ( I sc) produced by a module. Therefore, field-aged browned modules have been subjected to accelerated UV testing to obtain true end-of-life activation energy for the encapsulant browning mechanism. A novel time- and resource-saving accelerated UV exposure testing method simultaneously allowing multiple module temperatures to be maintained in a single chamber run is presented. Six field-aged crystalline silicon modules of glass/backsheet construction (three each from BP Solar/Solarex MSX 60 and Siemens M55) with similar glass and encapsulant formulation were exposed to a UV dosage of 450 kWh/m2. Through passive heating, the average module temperatures for the BP Solar/Solarex modules were 60 °C, 77 °C, and 85 °C and those of Siemens M55 were 75 °C, 80 °C, and 837 °C. To study UV browning, the modules were intermittently characterized through visual imaging, UV fluorescence imaging, electroluminescence imaging, quantum efficiency measurements, module, and cell-level light I – V measurements. An I sc decrease corroborated the increased extent of browning with increased module temperature. For the BP Solar/Solarex modules, the Low T, Mid T, and the High T modules showed a 1.37%, 2.48%, and 3.26% I sc drop, respectively. The Siemens modules showed a 4.11%, 5.65%, and 6.95% I sc drop. The multiple cell-level I sc data points obtained for each module temperature increased provided statistical significance. Activation energy for encapsulant browning was calculated as 0.44 and 0.72 eV for MSX 60 and M55 modules, respectively.

AbstractPhotovoltaic lifetime predictions are in great demand, but are exceedingly difficult to achieve with uncertainties small enough to be useful. During the construction of photovoltaic modules, small unplanned variability in materials or processes can have profound effects on module durability. Thus, continual monitoring of production quality is needed. In the subject production run, module quality, as monitored by damp heat testing, revealed a subset of modules that were prone to higher degradation rates.An assessment of the potential long‐term power loss and mitigation strategies was needed. To do this, modules were exposed to variable levels of humidity and temperature with periodic monitoring. The analysis takes into account the kinetics of the degradation and the spatially and temporally varying humidity content within the module during accelerated stress testing. This is an important aspect for extrapolating laboratory results to field exposure because moisture ingress is diffusion limited in most laboratory module tests but not limited in these fielded modules. This analysis predicted that although a solder flux induce degradation mechanism is significant in accelerated stress test, this is probably an artifact of a process with a very large acceleration factor that is not likely to be significant for deployed modules. The degradation mechanism affected a limited area around the tabbing helping to minimize the effect. Three years after the system was commissioned, the fielded modules indeed show no significant power loss.

AbstractIn the PV Fleet Performance Data Initiative, high‐frequency data from commercial and utility‐scale photovoltaic (PV) systems have been collected to examine performance loss rates (PLRs) at a fleet scale. To date, performance data from more than 7.2‐gigawatt (GW) capacity, 1700 sites and 19,000 inverters—approximately equivalent to 6% to 7% of the entire US PV market—have been collected. An overall PLR of −0.75%/year was found, which is in line with historical and recent findings. Tracked silicon (Si) and cadmium telluride (CdTe) performed comparably with all fixed‐tilt systems. Higher PLRs were found for hotter temperature zones; cooler climates exhibit a median −0.48%/year loss, which increases to −0.88%/year in hotter climates. High‐efficiency module technologies showed median PLRs in line with conventional Si technologies but demonstrated markedly different PLR behavior when filtered only for low‐light conditions <600 W/m2. Causes for this technology‐dependent behavior are under investigation.