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Measuring the Electronic Structure of Nanocrystal Thin Films Using Energy-Resolved Electrochemical Impedance Spectroscopy

pmid: 29485880
The Journal of Physical Chemistry Letters, 9 (6)
ISSN:1948-7185
- ETH Zurich Switzerland
energy-resolved electrochemical impedance spectroscopy, EIS, density of states; nanocrystal thin films; quantum dots; PbS; ligand; photovoltaics; nanocrystal doping; energy-resolved electrochemical impedance spectroscopy; EIS; ER-EIS, quantum dots, ligand, photovoltaics, density of states, ER-EIS, PbS, nanocrystal doping, nanocrystal thin films
energy-resolved electrochemical impedance spectroscopy, EIS, density of states; nanocrystal thin films; quantum dots; PbS; ligand; photovoltaics; nanocrystal doping; energy-resolved electrochemical impedance spectroscopy; EIS; ER-EIS, quantum dots, ligand, photovoltaics, density of states, ER-EIS, PbS, nanocrystal doping, nanocrystal thin films
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