• Energy Research

Time-resolved photoluminescence (TRPL) is applied to determine an effective lifetime of minority charge carriers in semiconductors. Such effective lifetimes include recombination channels in the bulk as well as at the surfaces and interfaces of the device. In the case of Cu(In,Ga)Se2 absorbers used for solar cell applications, trapping of minority carriers has also been reported to impact the effective minority carrier lifetime. Trapping can be indicated by an increased temperature dependence of the experimentally determined photoluminescence decay time when compared to the temperature dependence of Shockley–Read–Hall (SRH) recombination alone and can lead to an overestimation of the minority carrier lifetime. Here, it is shown by technology computer-aided design (TCAD) simulations and by experiment that the intentional double-graded bandgap profile of high efficiency Cu(In,Ga)Se2 absorbers causes a temperature dependence of the PL decay time similar to trapping in case of a recombinative front surface. It is demonstrated that a passivated front surface results in a temperature dependence of the decay time that can be explained without minority carrier trapping and thus enables the assessment of the absorber quality by means of the minority carrier lifetime. Comparison with the absolute PL yield and the quasi-Fermi-level splitting (QFLS) corroborate the conclusion that the measured decay time corresponds to the bulk minority carrier lifetime of 250 ns for the double-graded CIGS absorber under investigation.

Abstract There are different ways to determine the bandgap of a semiconductor. In the case of strong tailing they lead to different results. Various versions of Tauc’s plot give the gap of extended states, whereas the photoluminescence and the quantum efficiency extend into the tail states. The absorption edge in kesterite is determined by tail states therefore different methods to determine the band gap lead to different results. To decide whether the main recombination path is in the bulk or at the interface, the activation energy of the recombination rate should be compared to the energy of the radiative recombination in the bulk. This is the energy of the photoluminescence maximum and can be approximated by the linear extrapolation of the low energy edge of the quantum efficiency spectrum.

AbstractThis review summarizes the current status of Cu(In,Ga)(S,Se)2 (CIGS) thin film solar cell technology with a focus on recent advancements and emerging concepts intended for higher efficiency and novel applications. The recent developments and trends of research in laboratories and industrial achievements communicated within the last years are reviewed, and the major developments linked to alkali post deposition treatment and composition grading in CIGS, surface passivation, buffer, and transparent contact layers are emphasized. Encouraging results have been achieved for CIGS‐based tandem solar cells and for improvement in low light device performance. Challenges of technology transfer of lab's record high efficiency cells to average industrial production are obvious from the reported efficiency values. One section is dedicated to development and opportunities offered by flexible and lightweight CIGS modules. Copyright © 2016 John Wiley & Sons, Ltd.

Evaluating interfering capacitance steps in admittance spectroscopy for solar cell defect analysis is still a problem which needs to be solved. While the common analysis developed by Walter et al.[1] is capable of extracting defect distributions from the capacitance data, it results in erroneous defect densities in the presence of overlapping capacitance steps. We derive an expression for the capacitance step caused by defects with a density of states distributed in energy. By adding several of these defect distributions, interfering capacitance steps can be described. Thus, it is possible to fit the entire capacitance spectrum simultaneously for all temperatures. We apply the presented method to Cu 2 ZnSnSe 4 -based solar cells with power conversion efficiencies between 5% and 7%. Comparing the obtained defect parameters with the ones obtained by the method from Walter et al. reveals that the Walter method overestimates the defect densities in the case of overlapping capacitance steps.

Abstract Low temperature (100 and 250 °C) post-deposition annealings were applied to Cu 2 ZnSnSe 4 (CZTSe) absorbers to modify the ordering degree of the kesterite. Spectrophotometry and photoluminescence revealed a blue or red shift of the band gap and the luminescence peak after ordering or disordering post-treatments, respectively. For most solar cells, the open circuit voltage was found to be limited by bulk recombination and to follow band gap variations, leading to a constant open circuit voltage deficit. For the range of ordering degree investigated, the large open circuit voltage deficit, typically encountered in kesterite solar cells, could not be attributed to disorder. Capacitance–voltage measurements demonstrated that the net carrier concentration of ordered CZTSe is reduced by one order of magnitude compared to disordered CZTSe. Besides its beneficial effects on the open circuit voltage, the ordering post-treatment was also found to increase the collection of photo-generated carriers, resulting in a high current density and a significant improvement in device efficiency.

We present a high-temperature Cu $_2$ ZnSnSe $_4$ coevaporation study, where solar cells with a power conversion efficiency of 7.1% have been achieved. The process is monitored with laser light scattering in order to follow the incorporation of the Sn into the film. We observe the segregation of ZnSe at the Mo/CZTSe interface. Optical analysis has been carried out with photoluminescence and spectrophotometry. We observe strong band tailing and a bandgap, which is significantly lower than in other reported efficient CZTSe absorbers. The photoluminescence at room temperature is lower than the bandgap due to the existence of a large quantity of tail states. Finally, we present effects of low-temperature postannealing of the absorbers on ordering of the Cu/Zn atoms in CZTSe and solar cell parameters. We observe strong changes in all solar cell parameters upon annealing. The efficiency of the annealed devices is significantly reduced, although ordering is improved compared with ones made from nonannealed absorbers.

Multi-junction solar cells show the highest photovoltaic energy conversion efficiencies, but the current technologies based on wafers and epitaxial growth of multiple layers are very costly. Therefore, there is a high interest in realizing multi-junction tandem devices based on cost-effective thin film technologies. While the efficiency of such devices has been limited so far because of the rather low efficiency of semitransparent wide bandgap top cells, the recent rise of wide bandgap perovskite solar cells has inspired the development of new thin film tandem solar devices. In order to realize monolithic, and therefore current-matched thin film tandem solar cells, a bottom cell with narrow bandgap (~1 eV) and high efficiency is necessary. In this work, we present Cu(In,Ga)Se2 with a bandgap of 1.00 eV and a maximum power conversion efficiency of 16.1%. This is achieved by implementing a gallium grading towards the back contact into a CuInSe2 base material. We show that this modification significantly improves the open circuit voltage but does not reduce the spectral response range of these devices. Therefore, efficient cells with narrow bandgap absorbers are obtained, yielding the high current density necessary for thin film multi-junction solar cells.

AbstractInterface recombination in a complex multilayered thin‐film solar structure causes a disparity between the internal open‐circuit voltage (VOC,in), measured by photoluminescence, and the external open‐circuit voltage (VOC,ex), that is, a VOC deficit. Aspirations to reach higher VOC,ex values require a comprehensive knowledge of the connection between VOC deficit and interface recombination. Here, a near‐surface defect model is developed for copper indium di‐selenide solar cells grown under Cu‐excess conditions. These cell show the typical signatures of interface recombination: a strong disparity between VOC,in and VOC,ex, and extrapolation of the temperature dependent q·VOC,ex to a value below the bandgap energy. Yet, these cells do not suffer from reduced interface bandgap or from Fermi‐level pinning. The model presented is based on experimental analysis of admittance and deep‐level transient spectroscopy, which show the signature of an acceptor defect. Numerical simulations using the near‐surface defects model show the signatures of interface recombination without the need for a reduced interface bandgap or Fermi‐level pinning. These findings demonstrate that the VOC,in measurements alone can be inconclusive and might conceal the information on interface recombination pathways, establishing the need for complementary techniques like temperature dependent current–voltage measurements to identify the cause of interface recombination in the devices.